Automatic test pattern generation

Results: 55



#Item
21Electronics manufacturing / Electronic design / Design for X / Design for testing / Scan chain / Automatic test pattern generation / Integrated circuits / Boundary scan / Digital electronics / Electronic engineering / Design / Electronic design automation

Design Verification & Testing Design for Testability and Scan CMPE 418

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Source URL: www.csee.umbc.edu

Language: English - Date: 2004-12-01 12:51:01
22Design for testing / Built-in self-test / Automatic test pattern generation / High-level synthesis / Digital electronics / Electronic engineering / Electronic design automation / Design

BIST Hardware Synthesis for RTL Data Paths Based on Test Compatibility Classes Nicola Nicolici, Bashir M. Al-Hashimi, Andrew D. Brown, and Alan C. Williams Nicola Nicolici Bashir M. Al-Hashimi Andrew D. Brown

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Source URL: eprints.soton.ac.uk

Language: English - Date: 2009-12-08 11:04:34
23Digital electronics / Formal methods / Logic in computer science / Automata theory / Formal equivalence checking / Combinational logic / Sequential logic / Automatic test pattern generation / NC / Theoretical computer science / Electronic engineering / Applied mathematics

Combinational Techniques for Sequential Equivalence Checking Hamid Savoj1 David Berthelot1 Alan Mishchenko2

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Source URL: www.bvsrc.org

Language: English - Date: 2010-03-23 04:39:57
24Digital electronics / Electronic design / Formal methods / And-inverter graph / Retiming / Logic synthesis / Automatic test pattern generation / Field-programmable gate array / Sequential logic / Electronic engineering / Electronics / Electronic design automation

Integrating Logic Synthesis, Technology Mapping, and Retiming Alan Mishchenko Satrajit Chatterjee Robert Brayton

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Source URL: www.bvsrc.org

Language: English - Date: 2006-05-01 16:05:11
25Electronic design automation / Electronic design / Logic in computer science / And-inverter graph / Retiming / Logic optimization / Combinational logic / Automatic test pattern generation / Logic programming / Electronic engineering / Formal methods / Digital electronics

Microsoft Word - haig09.doc

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Source URL: www.bvsrc.org

Language: English - Date: 2008-03-23 19:52:58
26Digital electronics / Electronic design / And-inverter graph / Retiming / Logic optimization / Automatic test pattern generation / Combinational logic / Formal verification / Logic programming / Electronic engineering / Formal methods / Electronic design automation

Microsoft Word - haig14.doc

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Source URL: www.bvsrc.org

Language: English - Date: 2008-05-20 20:12:25
27Formal methods / Logic in computer science / NP-complete problems / And-inverter graph / Diagrams / Boolean satisfiability problem / Satisfiability / Logic synthesis / Automatic test pattern generation / Electronic engineering / Theoretical computer science / Electronic design automation

Improvements to Combinational Equivalence Checking Alan Mishchenko Satrajit Chatterjee Robert Brayton

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Source URL: www.bvsrc.org

Language: English - Date: 2006-08-09 21:17:37
28Applied mathematics / And-inverter graph / Electronic design automation / Subgraph isomorphism problem / Automatic test pattern generation / Graph isomorphism / Theoretical computer science / Mathematics / Diagrams

Incremental Sequential Equivalence Checking and Subgraph Isomorphism Sayak Ray Alan Mishchenko Robert Brayton

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Source URL: www.bvsrc.org

Language: English - Date: 2009-07-12 14:37:50
29Electronic design automation / Digital electronics / Logic in computer science / Electrical circuits / And-inverter graph / Retiming / Automatic test pattern generation / Formal verification / Combinational logic / Electronic engineering / Formal methods / Theoretical computer science

Scalably-Verifiable Sequential Synthesis Robert Brayton Alan Mishchenko Department of EECS, University of California, Berkeley

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Source URL: www.bvsrc.org

Language: English - Date: 2007-10-02 14:31:33
30Electronic design automation / Electrical circuits / And-inverter graph / Diagrams / Retiming / Automatic test pattern generation / Scan chain / Combinational logic / Sequential logic / Electronic engineering / Formal methods / Digital electronics

Scalable and Scalably-Verifiable Sequential Synthesis Alan Mishchenko Michael Case Robert Brayton

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Source URL: www.bvsrc.org

Language: English - Date: 2008-07-28 20:26:28
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